Methods of forming trench isolation regions
AssigneeMicron Technology, Inc.
InventorsTrung Tri Doan, Gurtej S. Sandhu
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AssigneeMicron Technology, Inc.
InventorsTrung Tri Doan, Gurtej S. Sandhu
Estimating the term…
In accordance with an aspect of the invention, a method of forming a trench isolation region includes forming a trench within a substrate. A silanol layer is formed to partially fill the trench and then converted, at least some of the silanol, to a compound including at least one of SiOn and RSiOn, where R includes an organic group. An electrically insulative material is formed over the converted silanol to fill the trench. In another aspect of the invention, a method of forming a trench isolation region includes forming a trench within a substrate. A first layer of at least one of Si(OH)x and (CH3)ySi(OH)4−y is formed to partially fill the trench. At least some of the Si(OH)x if present is converted to SiO2 and at least some of (CH3)ySi(OH)4−y if present is converted to (CH3)xSiO2−x. Next, a layer of an electrically insulative material is formed to fill the trench.
A method of forming a trench isolation region comprising:
A method of forming a trench isolation region comprising:
Dependencies are inferred from the claim text.