ESD-protection device with active R-C coupling to gate of large output transistor
AssigneePericom Semiconductor Corp.
InventorDavid Kwong
Life of this patent
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AssigneePericom Semiconductor Corp.
InventorDavid Kwong
Estimating the term…
Large output driver transistors are used to shunt electro-static-discharge (ESD) pulses. ESD pulses are capacitivly coupled to the gates of the large driver transistors by R-C networks. The capacitive coupling causes a gate-to-source voltage to exceed the transistor threshold, turning on the large driver transistor to shunt the ESD current. Transistor switches are inserted into the R-C networks. These transistor switches disconnect the R-C networks during normal operation, and ensure that the R-C networks couple the I/O pad to the gates of the output driver transistors only when power is turned off. Since ESD events normally occur when power is disconnected, such as during handling by a person or machine, the ESD protection is only needed when power is off. Thus an active ESD-protection device can be disabled during normal powered operation of the IC. A feedback circuit detects power and biases the gates of the transistor switches.
An integrated circuit (IC) with an output buffer with integrated electro-static-discharge (ESD) protection comprising:
An electro-static-discharge (ESD) protection circuit comprising:
An electro-static-discharge (ESD) protected output buffer comprising:
Dependencies are inferred from the claim text.