Asymmetrical devices for short gate length performance with disposable sidewall
AssigneeTexas Instruments Incorporated
InventorsTheodore W. Houston, Amitava Chatterjee
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AssigneeTexas Instruments Incorporated
InventorsTheodore W. Houston, Amitava Chatterjee
Estimating the term…
An asymmetrical channel implant from source to drain improves short channel characteristics. The implant provides a relatively high VT net dopant adjacent to the source region and a relatively low VT net dopant in the remainder of the channel region. One way to achieve this arrangement with disposable gate processing is to add disposable sidewalls inside the gate opening (after removing the disposable gate), patterning to selectively remove the source or gate side sidewalls, implant the source and drain regions and remove the remaining sidewall and the proceed. According to a second embodiment, wherein the channel implant can be symmetrical, a relatively low net VT implant is provided in the central region of the channel and a relatively high net VT implant is provided in the channel regions adjacent to the source and drain regions.
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A method of fabricating a transistor which comprises the steps of:
A method of fabricating a transistor which comprises the steps of:
A method of fabricating a transistor which comprises the steps of:
Dependencies are inferred from the claim text.