Thin film transistor
AssigneeSeiko Epson Corporation
InventorsBasil Lui, Piero Migliorato, Ichio Yudasaka, Mitsutoshi Miyasaka
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AssigneeSeiko Epson Corporation
InventorsBasil Lui, Piero Migliorato, Ichio Yudasaka, Mitsutoshi Miyasaka
Estimating the term…
A semiconductor transistor comprising a substrate having an active layer formed thereon, a source and a drain formed in the active layer, a gate insulating layer formed on the active layer and a gate electrode formed on the insulating layer, wherein the gate electrode is split, the active layer has a doped region located between the source and the drain and aligned with the split in the gate electrode, and the gate electrode is aligned with the drain so as not to overlap the drain. The transistor may be formed using a method comprising the steps of: providing a semiconductor layer in which the source and drain are to be formed; forming a gate insulating layer on the semiconductor layer; forming a split gate electrode on the gate insulating layer; and using the split gate electrode as a mask in the doping of a portion of the semiconductor layer between the source and the drain of the final transistor.
A method of manufacturing a semiconductor transistor having a gate, a source, a drain, and a recombination region located in closer proximity to the drain in comparison to the source, comprising the steps of:
A semiconductor transistor comprising a substrate having an active layer formed thereon, a source, a drain and a recombination region formed in the active layer, a gate insulating layer formed on the active layer and a gate electrode formed on the insulating layer, wherein the gate electrode is split at a position in closer proximity to a first edge of the gate electrode in comparison to a second edge of said electrode opposite to the first edge, the first edge of the gate electrode is aligned with the drain so as not to overlap the drain, and the recombination region is located between the source and the drain in closer proximity to the drain in comparison to the source and aligned with the split in the gate electrode for reducing the kink effect of the transistor.
Dependencies are inferred from the claim text.