Reticle having discriminative pattern narrower in pitch than the minimum pattern width but wider than minimum width in the pattern recognition
AssigneeNEC Corporation
InventorKazuki Yokota
Life of this patent
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AssigneeNEC Corporation
InventorKazuki Yokota
Estimating the term…
A reticle has a main pattern to be transferred to a photo-sensitive layer and surrounded by a non-transparent layer, and a discriminative pattern loops in the non-transparent layer so as to define an area to be inspected for serious defects, wherein the discriminative pattern is implemented by plural non-transparent portions such as strips arranged at intervals less than the minimum width to be transferred at the maximum resolution of the reduction projection aligner; however, the discriminative pattern or the plural non-transparent portions occupy a looped area wider than a minimum width to be recognized by a pattern recognition system so that the discriminative pattern clearly defines the area to be inspected regardless of the resolution.
A reticle used for a pattern transfer to a photo-sensitive layer, comprising:
Dependencies are inferred from the claim text.