Thermal treatment method and apparatus
AssigneeTokyo Electron Limited
InventorsYasushi Yagi, Takeshi Sakuma, Wataru Okase, Masayuki Kitamura, Hironori Yagi, Eisuke Morisaki
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AssigneeTokyo Electron Limited
InventorsYasushi Yagi, Takeshi Sakuma, Wataru Okase, Masayuki Kitamura, Hironori Yagi, Eisuke Morisaki
Estimating the term…
A semiconductor wafer is mounted on a susceptor disposed in a processing chamber, the wafer is heated at a temperature on the order of 1000° C. for annealing, and a gas is supplied from a gas supply device disposed opposite to the wafer. When raising the temperature of the wafer and/or when lowering the temperature of the wafer, intra-surface temperature difference is limited to a small value to suppress the occurrence of slips. A gas supply device is divided into sections corresponding to a central part and a peripheral part, respectively, of the wafer to supply the gas at different flow rates onto the central part and the peripheral part, respectively. When raising the temperature of the wafer, for example, a gas of a temperature higher (lower) than that of the wafer is supplied at a flow rate per unit area greater (lower) than that at which the gas is supplied to the peripheral part to the central part. When lowering the temperature of the wafer, for example, a gas of a temperature higher (lower) than that of the wafer is supplied at a flow rate per unit area lower (higher) than that at which the gas is supplied to the peripheral part to the central part.
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
A thermal treatment method comprising the steps of:
Dependencies are inferred from the claim text.