System and method for integrated singulation and inspection of semiconductor devices

An integrated singulation system comprising:

• an optical code reader for reading a code marked on a semiconductor device which is part of a strip of semiconductors, wherein the code indicates the test result of whether the individual semiconductor device passed an electrical test;
• and
• a singulation machine for cutting the strip of semiconductor devices into individual semiconductor devices and further comprising:
• a memory for storing the result of the electrical test for each semiconductor device;
• a processor for reading the test results stored in memory;
• and
• a sorter for sorting the semiconductor devices and discarding the semiconductor devices which failed the electrical test, wherein the sorter is controlled by the processor.

A method for inspecting semiconductor devices, comprising the steps of:

• electrically testing each semiconductor device in a strip of semiconductor devices;
• marking a code on each semiconductor device indicating the result of the electrical test;
• optically reading the code on said each semiconductor device in the strip of semiconductor devices;
• storing each code in a memory after the code has been read
• singulating the strip of semiconductor devices into individual semiconductor devices;
• and
• automatically discarding the semiconductor devices in which the code indicates that the semiconductor device failed the electrical test, in response to reading of the code on the semiconductor device.