Photolithography overlay control

In an alignment feature on a substrate, where the alignment feature is of the type concurrently formed with an electrically conductive layer overlying an electrically nonconductive layer having vias, where the vias are filled with an electrically conductive material, and the alignment feature has a smaller aspect ratio than the vias, and the alignment feature is not filled with the electrically conductive material when a first amount of the electrically conductive material sufficient to just fill the vias is deposited on the substrate, and the first amount of the electrically conductive material within the alignment feature is not sufficient to prevent the alignment feature in the electrically conductive layer from distorting and thereby reducing the effectiveness of the alignment feature, the improvement comprising an additional amount of the electrically conductive material on the substrate, which additional amount is more than the first amount just sufficient to fill the vias, and which additional amount fills the alignment feature to a level sufficient to prevent the alignment feature in the electrically conductive layer from distorting and reducing the effectiveness of the alignment feature.

A method for processing a layer on a substrate, the layer having an alignment feature and a via, the method comprising the steps of:

• applying tungsten on the substrate in an amount substantially greater than that necessary to fill the via and no more than that necessary to fill the alignment feature,
• removing the tungsten from an upper surface of the substrate while retaining the tungsten in the via and the alignment feature, and
• depositing metal on the substrate, including over the via and the alignment feature, where the metal over the alignment feature has a profile that is substantially free from distortions.