Method and apparatus to display processing parameter

An information handling system, comprising:

• a probe suitable for use with a test process on a plurality of cells, each of which is arranged on one of a plurality of wafers;
• a central processing unit having a memory, the central processing unit operatively coupled to receive signals from the probe indicative of the results of the test process;
• and
• a plurality of modules operatively coupled to the central processing unit for operating on the signals, the modules comprising:
• a data gathering module for gathering data regarding at least one test process of the plurality of cells;
• a characterization module for creating a selected set of information including a subset of the data;
• an output module for generating a graphical display output of the selected set of information;
• and
• a distribution module for providing access to the data, selected set of information, and the graphical display output.

A method reporting the results of a test process performed on a plurality of cells arranged on wafers over a series of manufacturing process runs, the method comprising:

• probing each of the cells and gathering data regarding the performance of that cell;
• storing the performance data on a computer system in at least one of a path corresponding to at least one particular wafer and a path corresponding to a series of manufacturing runs;
• arranging stored data relative to each cell for graphical display on a map at a location corresponding to the wafer location of that cell;
• and
• aggregating the stored data for a plurality of wafers for graphical display on the map thereby showing aggregate cell usage for each cell position for a series of manufacturing runs.

An information handling system, comprising:

• a probe suitable for use with a test process on a plurality of cells, each of which is arranged on one of a plurality of wafers;
• a central processing unit having a memory, the central processing unit operatively coupled to receive signals from the probe indicative of the results of each of the test processes;
• and
• a plurality of modules operatively coupled to the central processing unit for operating on the signals, the modules comprising:
• a data gathering module for gathering data regarding at least one test process of the plurality of cells;
• a characterization module for creating a selected set of information including a subset of the data;
• an output module for generating a graphical display output of the selected set of information;
• and
• a distribution module for providing access to the data, the selected set of information, and the graphical display output.