Method and apparatus of producing partial-area mask data files
AssigneeFujitsu Limited
InventorsMasahiko Minemura, Tomoyuki Okada, Ryo Tsujimura, Kenji Kikuchi, Yoshimasa Iiduka
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AssigneeFujitsu Limited
InventorsMasahiko Minemura, Tomoyuki Okada, Ryo Tsujimura, Kenji Kikuchi, Yoshimasa Iiduka
Estimating the term…
A full area of a semiconductor integrated circuit is divided into unit areas, a mask data file for use in a beam exposure system or an inspection apparatus is produced based on CAD data of the full area, full-area header information in which a starting address of a mask data of each unit area relates to positional information on said unit area, partial-area header information corresponding to each of partial areas obtained by division of the full area is produced based on the full-area header information and mask data of the partial areas are extracted from a mask data of the full area based on the partial area header information to produce the mask data files corresponding to the partial area header information.
A method of producing partial-area mask data files for use in a charged particle beam exposure system or an inspection apparatus based on a CAD data of a full area of a semiconductor integrated circuit, said partial-area mask data files being of respective partial areas obtained by dividing said full area, said method comprising:
A method of producing mask data files for an integrated circuit, comprising:
A method of producing mask data files for an integrated circuit, comprising:
Dependencies are inferred from the claim text.