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US 6,441,676 B1Granted
Externally programmable antifuse
AssigneeIntel Corporation
InventorsSean M. Koehl, Dean Samara-Rubio, Ding Yi
Life of this patent
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Abstract
A method for programming an antifuse circuit that includes a capacitor and a detector. The capacitor is formed using standard MOS processes in a well. The gate serves as one electrode and the well serves as another electrode of the capacitor. The antifuse is programmed by eternally provided radiation that can rupture the gate oxide so that the gate and the well can contact each other. The gate and well form a PN junction, transforming the capacitor into a diode. The diode provides the conductive path of the programmed antifuse.
Claims13
A method comprising:
- powering an integrated circuit device containing an antifuse circuit, the antifuse circuit containing a capacitor having two electrodes and a dielectric disposed between the two electrodes, one electrode being coupled to a bus line;
- aligning a source of radiation with respect to the dielectric;
- radiating the dielectric, wherein the radiation is configured to rupture the dielectric and cause the two electrodes to contact each other through the rupture, wherein the contacting electrodes form part of a diode coupled to conduct current between the bus line and one of the electrodes;
- detecting the rupture of the dielectric;
- and
- stopping the radiation of the dielectric.
3 more elements
An apparatus comprising:
- means for powering an antifuse circuit, the antifuse circuit containing a capacitor having two electrodes and a dielectric disposed between the two electrodes, one electrode being coupled to a bus line;
- means for radiating the dielectric, wherein the radiation is configured to rupture the dielectric and cause the two electrodes to contact each other through the rupture, wherein the contacting electrodes form part of a diode coupled to conduct current between the bus line and one of the electrodes;
- means for aligning the means for radiating to direct radiation to the dielectric;
- and
- means for detecting the rupture of the dielectric.
2 more elements
Dependencies are inferred from the claim text.