Superconducting damascene interconnected for integrated circuit

Abstract

A method of forming a superconducting damascene interconnect structure, and the structure made thereby, the method includes forming a cavity in an interlevel dielectric; forming a barrier layer in the cavity; forming a seed layer in the cavity over the barrier layer; filling the cavity by electrodepositing a Y—Ba—Cu alloy; and annealing in oxygen flow to form a Y—Ba—Cu—O superconductor on the barrier layer. In one embodiment, the superconductor has a formula YBa2Cu3O7-x, wherein x≦0.5. In another embodiment, the method includes forming a cavity in an interlevel dielectric; forming a Y—Ba—Cu alloy layer in the cavity; forming a seed layer in the cavity over the Y—Ba—Cu alloy layer; filling the cavity by electrodepositing a Y—Ba—Cu alloy fill; and annealing in oxygen flow to form a Y—Ba—Cu—O superconductor on the dielectric.

Dependencies are inferred from the claim text.