Deep trench bottle-shaped etching using Cl2 gas
AssigneesProMOS Technology, Inc., Mosel Vitelic, Inc., Siemens Aktiengesellschaft
InventorsMing-Horng Lin, Ray Lee, Nien-Yu Tsai
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AssigneesProMOS Technology, Inc., Mosel Vitelic, Inc., Siemens Aktiengesellschaft
InventorsMing-Horng Lin, Ray Lee, Nien-Yu Tsai
Estimating the term…
A method to fabricate bottle-shaped deep trench into a semiconductor substrate. After a neck profile is formed, the chlorine gas at a predetermined flow rate is added to the etching plasma gas composition, while the flow rates of the plasma gases are increased by about 30% by volume, to create an enlarged lower portion of the deep trench. Preferably, the neck portion is etched using an etching composition which contains HBr, NF3, and (He/O2) provided at flow rates of about 87:13:35 sccm. The enlarged lower portion is etched using an etching composition which contains HBr, NF3, and (He/O2) provided at flow rates of about 113±12:17±2:46±5 sccm, and Cl2 provided at a flow rate between 10 and 40 sccm. It was found that the width of the lower portion of the deep trench can be increased by 100% with minimum side effects such as polymer deposition in the plasma chamber, which could occur as result of substantially increased flow rate of HBr and/or NF3.
A method for forming a deep trench in a semiconductor substrate, comprising the steps of:
A method for forming a deep trench in a semiconductor substrate, comprising the steps of:
Dependencies are inferred from the claim text.