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US 6,297,995 B1Granted
Circuit configuration with a temperature-dependent semiconductor component test and repair logic circuit
AssigneeSiemens Aktiengesellschaft
InventorsRoderick Mc Connell, Detlev Richter
Life of this patent
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Abstract
A circuit configuration with a temperature-dependent semiconductor component self-test and repair logic circuit, in which at least one temperature sensor is provided in a semiconductor chip having a semiconductor component. In addition, the semiconductor component is connected in the semiconductor chip with the self-test and repair logic circuit.
Claims8
A circuit, comprising:
- a semiconductor chip, including:
- a semiconductor component;
- a self-test and repair logic circuit connected to said semiconductor component;
- and
- at least one temperature sensor connected to said self-test and repair logic circuit, said at least one temperature sensor measuring a temperature of said semiconductor chip.
2 more elements
Dependencies are inferred from the claim text.