Method and apparatus for reducing stress across capacitors used in integrated circuits
AssigneeIntel Corporation
InventorsRamkarthik Ganesan, Owen W. Jungroth
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AssigneeIntel Corporation
InventorsRamkarthik Ganesan, Owen W. Jungroth
Estimating the term…
A method, apparatus, and system for controlling the voltage levels across capacitors coupled between a first node and a second node of an integrated circuit so that the voltage levels across these capacitors will not exceed the breakdown voltage limitation of these capacitors. The voltage level between the first and second nodes of the integrated circuit can vary from a second voltage level to a first voltage level when the integrated circuit transitions from a second power state to a first power state, respectively. A first capacitor and a second capacitor are connected in series between the first and second nodes of the integrated circuit forming a middle node between the first and second capacitors. The voltage level of the middle node is set to a third voltage level when the integrated circuit is placed in the first power state such that the voltage level between the first and middle nodes does exceed the breakdown voltage of the first capacitor and the voltage level between the middle and second nodes does not exceed the breakdown voltage of the second capacitor.
A method of controlling the voltage levels across capacitors coupled between a first node and a second node of an integrated circuit so that the voltage levels across these capacitors will not exceed the breakdown voltage limitation of these capacitors, the voltage level between the first and second nodes varying from a second voltage level to a first voltage level when the integrated circuit transitions from a second power state to a first power state, the first power state corresponds to a low power state and the second power state corresponds to a high power state, the method comprising:
A method of controlling the voltage levels across capacitors coupled between a first node and a second node of an integrated circuit so that the voltage levels across these capacitors will not exceed the breakdown voltage limitation of these capacitors, the voltage level between the first and second nodes varying from a second voltage level to a first voltage level when the integrated circuit transitions from a second power state to a first power state, the method comprising:
In a charge pump having a plurality of pump stages connected in series, at least one of the pump stages including at least one node to be coupled to a corresponding clock signal via a capacitive device, the at least one node having a first voltage when the charge pump is in a first power state and a second voltage when the charge pump is in a second power state, a method of balancing the voltage requirement at the at least one node with the stress limitation and die area of the capacitive device, the method comprising:
A charge pump circuit including a plurality of pump stages being connected in series each having an input node and an output node, at least one of the pump stages comprising:
A charge pump stage in a charge pump circuit, the charge pump stage comprising:
Dependencies are inferred from the claim text.