Protection of semiconductor fabrication and similar sensitive processes
AssigneeExtraction Systems, Inc.
InventorsOleg P. Kishkovich, Devon A. Kinkead
Life of this patent
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AssigneeExtraction Systems, Inc.
InventorsOleg P. Kishkovich, Devon A. Kinkead
Estimating the term…
A detection system for detecting base contamination at low concentrations in gas, for instance to protect a sensitive process, characterized in that the detection system is constructed to examine multiple amines in gas to produce a reading stoichiometrically related to the proton bonding characteristic of the multiple amines present, the detection system comprising at least two channels through which a gas to be examined passes, an amines remover located in one of the channels, at least one thermal/catalytic converter which discharges NO for each channel, and at least one chemiluminescent NO detector, whereby the total amine concentration is determined from the difference between the detected signals for the channels.
A detection system for detecting base contamination in a semiconductor processing system comprising;
A detection system configured to monitor molecular amine contamination in sampled air by implementing the following steps:
Dependencies are inferred from the claim text.