Dynamic random access memory device
AssigneeKabushiki Kaisha Toshiba
InventorsShigeyoshi Watanabe, Tsuneaki Fuse, Koji Sakui, Masako Ohta, Yukihito Oowaki, Kenji Numata, Fujio Masuoka
Life of this patent
Estimating the term…
Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorsShigeyoshi Watanabe, Tsuneaki Fuse, Koji Sakui, Masako Ohta, Yukihito Oowaki, Kenji Numata, Fujio Masuoka
Estimating the term…
Here is disclosed a dynamic semiconductor memory of high integration density, which has parallel word lines and parallel bit lines formed on a substrate. The bit lines include a pair of bit lines. A memory cell is coupled to a word line and to one bit line of the bit-line pair. The memory cell is composed of MOSFETs of a submicron size. A sense amplifier section is connected to the pair of bit lines, and senses and amplifies the potential difference between the pair of bit lines in a data readout mode. The amplifier section has a BIMOS structure, having MOSFETs and bipolar transistors. It has a driver section comprised of bipolar transistors.
A dynamic semiconductor memory comprising:
A dynamic random access memory device, comprising:
A dynamic random access memory device, comprising:
In a dynamic random access memory device,
Dependencies are inferred from the claim text.