US 6,295,129 B1 · Arrangement and method for marking defects

Abstract

A method and device for marking defects in or on a substantially planar strip (70, 170), preferably a strip of polymeric film. The defect is marked by means of firstly illuminating the width across the strip (70, 170) by means of a light source (90, 190) and detecting defects in or on the strip (70, 170) by means of a detector (10, 300). The strip (70, 170) is placed in a plane in connection with the light source (90, 190) and wherein the incident light is reproduced on the detector (10, 300). Thereafter, the defect is marked by means of a marker (200) which is placed in connection with the defect. The marker (200) is placed on a label (62, 162), which is attached onto the strip (70, 170).

Claims7

Dependent claims

A method for marking defects in or on a substantially planar strip of polymeric film, wherein the defect is marked by firstly:

a) illuminating substantially the width of the strip by a light source;
b) detecting defects in or on said strip by a detector, wherein said strip extends along a plane which is adjacent to said light source and wherein light striking said strip is reproduced on said detector, and thereafter marking the defect by a marker which is placed in close proximity to said defect so as to indicate the position of the defect, wherein said marker is placed on a label, wherein said label is also provided with information corresponding to the dimensions and/or the position of said defect and that said label is attached onto said strip such that the proximate location of said marker indicates said position in both a longitudinal and a transverse axis of said planar strip.

Dependencies are inferred from the claim text.

Arrangement and method for marking defects

Life of this patent

Arrangement and method for marking defects

Life of this patent

Abstract

Claims7