Polishing apparatus
AssigneeEbara Corporation
InventorsMasao Yoshida, Masahiko Sekimoto
Life of this patent
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AssigneeEbara Corporation
InventorsMasao Yoshida, Masahiko Sekimoto
Estimating the term…
The present invention relates to a polishing apparatus for polishing a workpiece such as a semiconductor wafer. The polishing apparatus has a processing section including a polishing section (1) for polishing a semiconductor wafer (6) and a cleaning section (10) for cleaning a polished semiconductor wafer, a receiving section (40) for supplying a semiconductor wafer (6) to be polished to the processing section and receiving a polished semiconductor wafer (6), and a cleaning chamber (20) disposed between the processing section and the receiving section and defined by partitions (102, 103) with shutters (22, 24) which separate the processing section and the receiving section from each other.
A polishing apparatus for polishing a workpiece, comprising:
A polishing apparatus for polishing a workpiece, comprising:
Dependencies are inferred from the claim text.