Substrate transfer system for semiconductor processing equipment
AssigneeASM America, Inc.
InventorsIvo Raaijmakers, Loren R. Jacobs, Michael W. Halpin, James A. Alexander, Ken O'Neill, Dennis L. Goodwin
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AssigneeASM America, Inc.
InventorsIvo Raaijmakers, Loren R. Jacobs, Michael W. Halpin, James A. Alexander, Ken O'Neill, Dennis L. Goodwin
Estimating the term…
A system for facilitating wafer transfer comprises a susceptor unit consisting of an inner susceptor section which rests within an outer susceptor section. A vertically movable and rotatable support spider located beneath the susceptor unit can rotate into positions to engage either the inner or the outer susceptor sections. When the inner section is engaged, the support spider lifts the inner section vertically out of the outer section. When the outer section is engaged, the support spider raises and lowers the entire susceptor unit. A robotic arm end effector engaging only the lower surface of the outer edge of the wafer permits hot wafer pick-up and unloading by the inner susceptor section. Several end effectors are disclosed that minimize non-uniform thermal effect on the substrate.
An apparatus for supporting and handling a substrate in a substrate processing system, comprising:
A method of transferring a substrate with respect to a susceptor in a chamber comprising the steps of:
An apparatus for processing semiconductor wafers comprising:
A method of transferring a substrate within a chamber, comprising the steps of:
A method of transferring a thin, flat substrate to a susceptor comprising the steps of:
A method of transferring a thin, flat substrate comprising the steps of:
A method of processing a thin, flat substrate comprising:
An apparatus for supporting and handling a substrate in a substrate processing system comprising:
An apparatus for supporting and handling a substrate in a substrate processing system comprising a paddle and a plurality of support elements mounted to the paddle and extending above the paddle, said elements being configured to engage and support the periphery of a substrate, said elements being sufficiently tall to space the substrate above the paddle a sufficient distance to prevent the paddle from having any substantial thermal effect on aid substrate.
An apparatus for supporting and handling a substrate in a substrate processing system comprising an end effector to be mounted on a robotic arm, said end effector including a support that extends generally parallel to a substrate to be carried by the end effector, and a plurality of support elements attached to said support configured to engage the periphery of the substrate at spaced locations and to hold the substrate closely spaced and substantially parallel to said support, said support having an area adjacent the substrate which is at least about 80% that of the substrate so that any thermal effect on the substrate caused by said support is substantially uniform.
Dependencies are inferred from the claim text.