Circuit and method for reducing parasitic bipolar effects during electrostatic discharges

Abstract

A semiconductor device including a current source having a first node coupled to a terminal, and a second node for extracting a current in response to an electrostatic discharge (ESD) on the terminal. The semiconductor device further including a transistor having a control electrode, a first current electrode coupled to the terminal, and a second current electrode coupled to the second node of the current source, and including a resistive element coupled to a first voltage reference node and the second node of the current source. The transistor of the semiconductor device is biased by detecting a negative voltage event (such as an ESD) at a first current electrode of the transistor and biasing a second current electrode of the transistor in response to detecting the negative voltage event, wherein the biasing of the second current electrode is for preventing a forward biasing of an p-n junction associated with the transistor.

Dependencies are inferred from the claim text.