Touch calibration system for wafer transfer robot
AssigneeBerkeley Process Control, Inc.
InventorsPaul Sagues, Robert T. Wiggers, Steven M. Kraft
Life of this patent
Estimating the term…
Loading patent…
AssigneeBerkeley Process Control, Inc.
InventorsPaul Sagues, Robert T. Wiggers, Steven M. Kraft
Estimating the term…
A method and apparatus for automatically calibrating the precise positioning of a wafer handling robot relative to a target structure is disclosed. The apparatus comprises a machine controller connected to robot having an end-effector with three degrees of movement. The controller has a memory with stored rough distance and geometrical data defining the general location of structural features of the target structure. The robot is programmed to move toward the target structure in a series of sequential movements, each movement culminating with the robot end-effector touching a preselected exterior feature of the target structure. Each touching of the end-effector is sensed and provides data for the controller which then calculates the precise location of the target structure. The data accumulated during a series of touching steps by the robot end-effector is utilized by the controller to provide a precise calibrated control program for future operation of the robot.
A method for automatically calibrating the positioning of a wafer handling robot to a precise, desired location within an enclosure forming a process station having an opening and exterior structural features, said robot having an articulated arm with an end-effector that is movable in the vertical (Z), angular (⊖), and radial (R) directions and is connected to a controller having memory and logic sections, said method including the steps of:
A method for automatically calibrating the positioning of the end-effector of a wafer handling robot to a precise location within an enclosure forming a process or storage station for wafers said enclosure having a frontal opening and exterior structural features, said robot having a fixed body with an articulating arm having said end-effector that is movable in the vertical (Z), angular e, and radial (R) directions and is connected to a controller having memory and logic sections, said method comprising the steps of:
A method for automatically calibrating the positioning of the end-effector of a wafer handling robot to a precise location relative to a target structure such as a process or storage station for wafers, said robot having a fixed body with an articulating arm with said end-effector at its outer end, said arm being movable in the vertical (Z), angular (⊖) and radial (R) directions and being connected to a machine controller having memory and logic sections, said end-effector having sensor means mounted therein, said method comprising the steps of:
An automatic calibration system for a wafer transport robot having a main body with an articulating arm and an end-effector, said robot having servo motor means for causing its movement in the radial (R), circular (⊖), and vertical (Z) axes, each said servo motor means including means for digitally measuring its axis velocity, controller means for storing instructions for moving said robot end-effector toward a pre-selected target structure, means associated with said controller means for detecting a reduction in the velocity of a servo motor means when said end-effector touches the target structure, and means for recording the precise position of said end-effector at said target structure relative to said main body of said robot when the touching of the target structure occurs and causes the reduction in servo motor velocity.
Dependencies are inferred from the claim text.