Developing method and developing apparatus
AssigneeTokyo Electron Limited
InventorsNobuo Konishi, Takayuki Toshima, Tsutae Omori
Life of this patent
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Abstract
When a resist film formed on a substrate is exposed in a predetermined pattern and thereafter an exposed pattern is developed, a substance capable of decreasing fluidity of the developing solution is added to the developing solution, the developing solution to which the substance is added is caused to become low-fluid under a predetermined condition, the developing solution is applied onto the exposed resist film on the substrate, and thereafter a predetermined trigger is given to the developing solution to cause the developing solution to become high-fluid so as to allow developing to progress. Thereby, line width can be made uniform and defects do not tend to occur during coating of the developing solution.
Claims6
A developing method for developing an exposed pattern after a resist film formed on a substrate is exposed in a predetermined pattern, comprising the steps of:
- (a) adding a substance capable of decreasing fluidity of a developing solution to the developing solution;
- (b) causing the developing solution to which the substance is added to become low-fluid under a predetermined condition and applying the developing solution onto the exposed resist film on the substrate;
- and
- (c) giving a predetermined trigger to the developing solution to cause the developing solution to become high-fluid to allow developing to progress.
Dependencies are inferred from the claim text.