Probe, method of its manufacturing, and probe-type memory
AssigneeSharp Kabushiki Kaisha
InventorYasushi Ogimoto
Life of this patent
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AssigneeSharp Kabushiki Kaisha
InventorYasushi Ogimoto
Estimating the term…
A probe comprising a core (2) having a first end part (2a) on which light from a light source is incident and a second end part (2b) with a diameter smaller than a wavelength of the incident light and a cladding (1) covering the core (2). A thin nitride film (3) made of at least one nitride selected from titanium nitride, zirconium nitride, and hafnium nitride is formed on a surface of the core (2) on the side of the second end part (2b) except the first and second end parts (2a) and (2b). The thin nitride film (3) has a high reflectivity for light with a wavelength of longer than 600 nm and the incident light does not leak out of the probe and reaches the tip of the probe, so that the intensity of the light emitted from the tip of the probe is improved. When the probe is used in a probe-type memory, high density recording with an excellent signal quality (S/N) can be realized.
A probe comprising a core having a first end part on which light from a light source is incident and a second end part with a diameter smaller than a wavelength of said incident light and a cladding covering said core,
A probe comprising a cylindrical body having a first aperture part on which light from a light source is incident and a second aperture part with a diameter smaller than a wavelength of said incident light,
Dependencies are inferred from the claim text.