Method of plasma etching the tungsten silicide layer in the gate conductor stack formation
AssigneeInternational Business Machines Corporation
InventorPascal Costaganna
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Abstract
A method of plasma etching a Si3N4 masked tungsten silicide layer down to an underlying doped polysilicon layer in the gate conductor stack formation process is disclosed. The method is performed in a plasma etcher and the etching mixture contains C12, HCl and O2 wherein the C12/HCl ratio is approximately equal to 4.7 and the oxygen flow varies between 20 and 30 sccm, 25 sccm being the optimal value. A slight overetching of the underlying doped polysilicon layer with this mixture is recommended. The etching method of the present invention preserves the thickness and integrity of the top Si3N4 masking layer that are essential elements for the successful completion of the remaining steps of the gate conductor stack formation process.
Claims8
Method of plasma etching a Si3N4 masked tungsten silicide layer formed on a substrate comprising the steps of:
- (a) providing a plasma etch reactor having a wafer holder whereupon the substrate is mounted;
- (b) providing (1) an etching mixture containing C12, HCl and O2 in said reactor wherein the Cl2/HCl ratio is approximately equal to 4.7 and the oxygen flow varies between 20 and 30 sccm, and (2) a power of more than 200 watts to produce a plasma environment;
- (c) exposing the substrate to said plasma environment for a time sufficient to etch the tungsten silicide layer down to the substrate anisotropically, thereby obtaining an etched tungsten silicide feature having a lateral dimension substantially equal to that of the Si3N4 mask.
Method of plasma etching a Si3N4 masked tungsten silicide layer formed on a doped polysilicon layer overlying a substrate comprising the steps of:
- (a) providing a plasma etch reactor having a wafer holder whereupon the substrate is mounted;
- (b) providing (1) an etching mixture containing Cl2, HCl and O2 in said reactor wherein the Cl2/HCl ratio is approximately equal to 4.7 and the oxygen flow varies between 20 and 30 sccm and (2) a power of more than 200 watts to produce a plasma environment;
- (c) exposing the substrate to said plasma environment for a time sufficient to etch the tungsten silicide layer down to the doped polysilicon layer anisotropically, thereby obtaining an etched tungsten silicide feature having a lateral dimension substantially equal to that of the Si3N4 mask.
Method of plasma etching a Si3N4 masked tungsten silicide layer formed on a substrate comprising the steps of:
- (a) providing a plasma etch reactor having a wafer holder whereupon the substrate is mounted;
- (b) providing (1) an etching mixture containing Cl2, HCl and O2 in said reactor wherein the C12/HCl ratio is approximately equal to 4.7 and the oxygen flow varies between 20 and 30 sccm and is greater than the HCl flow, and (2) a power of more than 200 watts to produce a plasma environment;
- (c) exposing the substrate to said plasma environment for a time sufficient to etch the tungsten silicide layer down to the substrate anisotropically, thereby obtaining an etched tungsten silicide feature having a lateral dimension substantially equal to that of the Si3N4 mask.
Method of plasma etching a Si3N4 masked tungsten silicide layer formed on a doped polysilicon layer overlying a substrate comprising the steps of:
- (a) providing a plasma etch reactor having a wafer holder whereupon the substrate is mounted;
- (b) providing (1) an etching mixture containing Cl2, HCl and O2 in said reactor wherein the C12/HCl ratio is approximately equal to 4.7 and the oxygen flow varies between 20 and 30 sccm and is greater than the HCl flow, and (2) a power of more than 200 watts to produce a plasma environment;
- (c) exposing the substrate to said plasma environment for a time sufficient to etch the tungsten silicide layer down to the doped polysilicon layer anisotropically, thereby obtaining an etched tungsten silicide feature having a lateral dimension substantially equal to that of the Si3N4 mask.
Dependencies are inferred from the claim text.