Method of multi-exposure for improving photolithography resolution
AssigneeWorldwide Semiconductor Manufacturing Corp.
InventorsJun-Cheng Lai, Yeur-Luen Tu, Chine-Gie Lou
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Abstract
A multi-exposure process. By performing the multi-exposure process, the size of the line width can be enlarged or shrunk by the precondition of the fixed pitch. Moreover, the line width can be shrunk to a level even smaller than the resolving power of the stepper or the scanner. Additionally, by using the invention, the exposure energy, the exposure time and the exposure DOF can be fixed while the exposure process is performed. Therefore, the process window is increased and the yield is enhanced. Furthermore, the processing sequence according to the invention is simpler than the conventional photolithography processing sequence, so that the throughput can be increased.
Claims6
A method of multi-exposure for improving photolithography resolution that comprises the step of:
- providing a wafer having a photoresist formed thereon;
- providing a photomask aligned above with the wafer;
- performing a first exposure to simultaneously form a first exposed region and an unexposed region in the photoresist;
- performing a first shift of the wafer parallel to the photomask resulting in a first relative and parallel shift movement, wherein the first relative and parallel shift movement has a first direction and a first relative shift distance;
- performing a second exposure to convert a portion of the unexposed region adjacent to the first exposed region into a second exposed region in the photoresist;
- performing a second shift of the wafer parallel to the photomask resulting in a second relative and parallel shift movement, wherein the second relative and parallel shift movement has a second direction and a second relative shift distance;
- performing a third exposure to convert a portion of the remaining unexposed region adjacent to the first exposure into a third exposed region in the photoresist;
- and
- performing a development of the photoresist.
Dependencies are inferred from the claim text.