Design verification for asymmetric phase shift mask layouts
AssigneeInternational Business Machines Corporation
InventorLars Wolfgang Liebmann
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Abstract
A checking routine verifies a phase shifted mask (PSM) design based on fundamental principles of PSM and utilizing only basic shape manipulation functions and Boolean operations found in most computer aided design (CAD) systems. The design verification system checks complete chip designs for the two possible design errors that can cause defective masks by eliminating the phase transition; namely, placing a 180° phase region on both sides of a critical feature or completely omitting the phase region adjacent to certain critical features.
Claims8
A computer implemented method of design verification for asymmetric phase shift mask layouts comprising the steps of:
- isolating “critical” features in a design based on criteria that were applied in an original design routine;
- expanding the designed phase regions by the width of the largest “critical” features to give shapes A;
- locating all overlaps of the expanded phase regions to identify shapes B;
- isolating any defective “critical” features by first subtracting the overlap region shapes B from the expanded phase region shapes A to produce phase regions shapes C, and then subtracting the remaining phase regions shapes C from the isolated “critical” features, leaving only “critical” features that were either covered by the overlap of two phase regions or were not covered by a phase region at all;
- and
- presenting to a designer design conflicts characterized as “critical” features that either have a phase region on both sides or have no adjacent phase region at all.
A computer implemented method of phase edge phase shift mask (PSM) design verification directly in a design of a very large scale integrated (VSLI) circuit design comprising the steps of:
- geometrically expanding the designed phase regions;
- identifying all overlaps of the expanded phase regions;
- subtracting the overlaps of the expanded phase regions from the expanded phase regions using a Boolean difference operation to produce features that were either covered by the overlap of two phase regions or were not covered by a phase region at all;
- and
- displaying design conflicts that either have a phase region on both sides or have no adjacent phase region at all.
Dependencies are inferred from the claim text.