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US 6,184,549 B2Granted
Trench storage dynamic random access memory cell with vertical transfer device
AssigneeInternational Business Machines Corporation
InventorsToshiharu Furukawa, Mark C. Hakey, David V. Horak, William H. Ma, Jack A. Mandelman
Life of this patent
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Abstract
A trench storage dynamic random access memory cell with vertical transfer device can be formed in a wafer having prepared shallow trench isolation. Vertical transfer device is built as the deep trenches are formed. Using square printing to form shallow trench isolation and deep trenches, allows for scaling of the cell to very small dimensions.
Claims2
A trench storing dynamic random access memory cell with vertical transfer device, comprising:
- deep trenches formed in a p type substrate having a lower portion partially filled with n+ polysilicon storage node electrode and surrounded by an n+ silicon storage plate;
- a vertical metal oxide semiconductor field effect transistor transfer device in an upper portion of said deep trenches;
- a collar isolation oxide in an upper portion of said deep trenches on a multiplicity of sidewalls of said deep trenches between an n+ buried strap diffusion of said metal oxide semiconductor field effect transistor and said n+ silicon storage plate;
- a recessed polysilicon gate conductor positioned within an upper portion of said deep trenches gating a p type silicon adjacent said deep trench and connecting an n+ bit line diffusion positioned above said p type silicon and said n+ buried strap diffusion;
- and
- a multiplicity of recessed active and passing word line conductors on an insulating layer above said deep trenches.
3 more elements
A trench storing dynamic random access memory cell with vertical transfer device comprising:
- deep trenches formed in an n type substrate having a lower portion partially filled with p type polysilicon storage node electrode and surrounded by a p type silicon storage plate;
- a vertical metal oxide semiconductor field effect transistor device in an upper portion of said deep trenches;
- a collar isolation oxide in an upper portion of said deep trenches on a multiplicity of sidewalls of said deep trenches between a p type buried strap diffusion of said metal oxide semiconductor field effect transistor and said p type silicon storage plate;
- a recessed polysilicon gate conductor positioned within an upper portion of said deep trenches gating an n type silicon adjacent said deep trench and connecting a p type bit line diffusion positioned above said n type silicon and said p type buried strap diffusion;
- and
- a multiplicity of recessed active and passing word line conductors on an insulating layer above said deep trenches.
3 more elements
Dependencies are inferred from the claim text.