Methods for growing defect-free heteroepitaxial layers
AssigneeCornell Research Foundation, Inc.
InventorYu-Hwa Lo
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AssigneeCornell Research Foundation, Inc.
InventorYu-Hwa Lo
Estimating the term…
New methods for growing threading dislocation free heteroepitaxy are proposed and investigated theoretically. The first method contains four key steps: Stranski-Krastanov island formation, strain relaxation by defect nucleation, in-situ defect removal, and island coalescence. The central idea is that the defects are utilized to relax the lattice strain, and as soon as the strain is relaxed, the dislocation segments are removed that will propagate to the surface of the film. As a result, the heteroepitaxial film is expected to be relaxed but be free of harmful threading dislocations regardless of the degree of lattice mismatch. In the second method, single crystal islands or patches are grown initially which are a few hundred nanometers or less in diameter. The patches serve as nucleation sites for growth of single crystal heteroepitaxial layers. Because of the very small patch size, the stress (normal stress and shear stress) due to lattice mismatch will be reduced significantly. As the growth proceeds, the size of nucleation islands increases in both vertical and lateral directions and the discrete islands soon coalesce to form a continuous thin film. If all coalescing islands have the same or nearly the same crystal orientation, then the net stress will be close to zero, and a smooth, defect-free heteroepitaxial layer can be grown to any thickness.
A method for growing a defect-free heteroepitaxial layer on a substrate comprising the steps of:
A method for growing a defect-free heteroepitaxial layer on a substrate comprising the steps of:
A method for growing a defect-free heteroepitaxial layer on a substrate comprising the steps of:
Dependencies are inferred from the claim text.