Method of fabricating STI
AssigneesUnited Silicon Incorporated, United Microelectronics Corp.
InventorTong-Hsin Lee
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AssigneesUnited Silicon Incorporated, United Microelectronics Corp.
InventorTong-Hsin Lee
Estimating the term…
A fabrication method for shallow trench isolation (STI) is briefly described as follows. A substrate is provided with a patterned mask layer and pad oxide layer formed thereon, so that a first opening, which exposes a part of the substrate, is formed. A shallow trench is then formed in the substrate, followed by filling the shallow trench with a first insulating layer, wherein the surface of the first insulating layer is lower than the surface of the substrate, and a part of the substrate forming the sidewall of the shallow trench is exposed. A part of the mask layer and pad oxide layer is removed to enlarge the first opening, so that a second opening, which exposes a part of the substrate, is formed. A doped region is formed on the exposed part of the substrate, while the second opening and the shallow trench are filled with a second insulating layer. Finally, the mask layer and the pad oxide layer are removed in sequence to complete the manufacture of the STI.
A fabrication method for a shallow trench isolation (STI), the method comprising steps of:
A fabrication method for a STI, wherein a substrate is provided with a patterned mask layer and pad oxide layer formed thereon, with a first opening which exposes a part of the substrate, the method comprising steps of:
Dependencies are inferred from the claim text.