Overlay measurement technique using moire patterns
AssigneesSiemens Aktiengesellschaft, International Business Machines Corporation
InventorsKarl Paul Muller, Venkatachalam C. Jaiprakash, Christopher J. Gould
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Abstract
Misalignment between two masking steps used in the manufacture of semiconductive devices in a wafer is determined by having a special alignment pattern on each of two masks used in the process and forming images of the masks on the semiconductor devices with the images of the alignment patterns being superimposed over one another to form a Moire pattern. The Moire pattern is compared with other Moire patterns known to correspond to particular amounts of misalignment of the masks to see if it corresponds to an acceptable alignment.
Claims5
A process for detecting misalignment of the two masking steps in the manufacture of semiconductive devices comprising the steps of:
- including in each of the two masks used for the masking steps a repetitive pattern of marks that is made different by a prescribed amount in the two masks such that when superposed on one another the masks generate a Moire pattern that is a measure of the degree of misalignment between the two masks;
- using the two masks to form at the surface of the semiconductive wafer being processed, the patterns of marks of the two masks superposed on one another for generating a Moire pattern;
- observing optically the Moire pattern generated;
- and
- comparing the Moire pattern observed with Moire patterns corresponding to an acceptable alignment between the two masks.
Dependencies are inferred from the claim text.