Photosensitive resin composition for far-ultraviolet exposure
AssigneeFuji Photo Film Co., Ltd.
InventorsKenichiro Sato, Kunihiko Kodama, Kazuya Uenishi, Toshiaki Aoai
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Abstract
A photosensitive resin composition for far-ultraviolet exposure of from 170 to 220 nm, which comprises an N-hydroxymaleinimide-type sulfonate photo acid generator having a specific structure and a resin having a substituent capable of increasing the solubility to an alkali developer by an acid, and a pattern forming method using the photosensitive resin composition. The photosensitive resin composition has a high transparency to light having a wavelength of from 170 to 220 nm and is excellent in the photocomposition property and the acid generating efficiency.
Claims3
A pattern forming method, which comprises:
- forming a thin film of a photosensitive resin composition on a substrate, light-exposing the thin film with an ArF excimer laser, and developing the exposed thin film,
- said photosensitive resin composition comprising a non-aromatic series resin having a substituent capable of increasing the solubility of the resin in an alkali developer by an acid and an N-hydroxymaleinimide sulfonate photo acid generator represented by formula (I):
- ##STR17## wherein R.sub.1 and R.sub.2, which may be the same or different, each represents a hydrogen atom, an alkyl group having from 1 to 6 carbon atoms, or a cycloalkyl group having not more than 6 carbon atoms;
- R.sub.1 and R.sub.2 may combine via an alkylene chain to form a ring;
- and R.sub.3 represents an alkyl group, a perfluoroalkyl group, a cyclic alkyl group, or a camphor group,
- wherein the resin has an alicyclic alkyl group in the side chains.
Dependencies are inferred from the claim text.