Method of manufacturing a radiation-resistant semiconductor integrated circuit
AssigneeNEC Corporation
InventorYoshiaki Sera
Life of this patent
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Abstract
A method for fabricating a semiconductor integrated circuit having MOS (Metal-Oxide-Semiconductor) transistors which do not produce increased leakage currents upon exposure to radiation and which are free of lateral diffusion of impurities from channel stopper layers. The method comprises the steps of (a) applying ions of an impurity of one conductivity type with a relatively high energy toward a central region of a field oxide film formed as a isolating region in a semiconductor substrate of the same conductivity type as the one conductivity type; and (b) applying ions of the impurity with a relatively low energy toward at least a peripheral region of the field oxide film.
Claims5
A method of manufacturing a semiconductor integrated circuit, comprising the steps of:
- providing a substrate of one conductivity type with a field oxide embedded partially within said substrate and extending partially above said substrate, said field oxide having a central region which is thicker than a peripheral region designated as a bird's beak and wherein said bird's beak is formed such that it tapers in thickness from a thickest portion immediately adjacent to said central region of said field oxide to a thinnest portion at a point on the surface of said substrate;
- directing ions of an impurity onto only said central region of said field oxide by using a relatively high first implantation energy, said first implantation energy being sufficient to pass said ions through said central region and into said semiconductor substrate beneath said central region, said impurity being of a conductivity type which is the same as said one conductivity type;
- and
- directing ions of said impurity by using a relatively low second implantation energy, lower than said first implantation energy, onto only said field oxide, said second implantation energy being sufficient to pass said ions through said bird's beak and into said semiconductor substrate beneath said bird's beak but said second implantation energy not being sufficient to pass said ions through said central region;
- wherein, upon applying ions of said impurity by using said first and second implantation energies, a channel stopper layer is formed in contact with an entire lower surface of said field oxide including said central region and said bird's beak.
A method of manufacturing a semiconductor integrated circuit, comprising the steps of:
- forming a field oxide on a silicon substrate of one conductivity type, said field oxide having a central region which is thicker than a peripheral region designated as a bird's beak and wherein said bird's beak is formed such that it tapers in thickness from a thickest portion immediately adjacent to said central region of said field oxide to a thinnest portion at a point on the surface of said substrate;
- forming a first resist film on a surface of said silicon substrate including said field oxide, providing a first window in said first resist film to expose only said central region of said field oxide, and directing ions of an impurity by using a first implantation energy toward said first resist film, such that said ions of said impurity pass through said first window and said central region, and into said silicon substrate below said central region of said field oxide, said impurity being of a conductivity type which is the same as said one conductivity type;
- and
- removing said first resist film, forming a second resist film on said surface of said silicon substrate including said field oxide, providing a second window in said second resist film to expose only said central region and said bird's beak of said field oxide, and directing ions of said impurity by using a second implantation energy, lower than said first implantation energy, toward said second resist film, such that said ions of said impurity pass through said second window and said bird's beak, and into said silicon substrate below said bird's beak of said field oxide, said second implantation energy being insufficient to pass said ions of said impurity through said central region of said field oxide.
Dependencies are inferred from the claim text.