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US 6,143,669 AGranted
Method of growing gate oxides
AssigneeHyundai Electronics Industries Co., Ltd.
InventorWon Ju Cho
Life of this patent
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Abstract
A method for manufacturing a gate oxide film in a semiconductor device includes: preparing a semiconductor substrate having a first and a second active region; implanting germanium ions into the first active region; and forming a first and a second gate oxide films on the first and the second active regions, respectively, wherein the first gate oxide film is thicker than the second gate oxide film.
Claims14
A method for manufacturing a gate oxide film comprising:
- preparing a semiconductor substrate having a first and a second active region;
- implanting germanium ions into the first active region;
- and
- forming a first and a second gate oxide film simultaneously on the first and the second active regions, respectively, wherein the first gate oxide film is thicker than the second gate oxide film.
1 more element
A method for manufacturing a gate oxide film comprising:
- preparing a semiconductor substrate having a first and a second active region;
- forming a masking layer on the second active region;
- implanting germanium ions into the semiconductor substrate, wherein the germanium ions are piled up into the surface of the semiconductor substrate in the first active region and into the masking layer in the second active region;
- and
- forming a first and a second gate oxide film simultaneously on the first and the second active regions, respectively, wherein the first gate oxide film is thicker than the second gate oxide film.
2 more elements
A method for manufacturing a gate oxide film, comprising:
- preparing a semiconductor substrate having a first and a second active region and an isolation region therebetween;
- forming an isolation film on the isolation region;
- forming a masking layer on the second active region;
- implanting germanium ions into the semiconductor substrate, wherein the germanium ions are piled up into the surface of the semiconductor substrate in the first active region and the masking layer in the second active region;
- and
- forming a first and a second gate oxide film simultaneously on the first and the second active regions respectively, wherein the first gate oxide film is thicker than the second gate oxide film.
3 more elements
Dependencies are inferred from the claim text.