Method of cleaning semiconductor wafers and other substrates
AssigneeLam Research Corporation
InventorsDonald Edgar Stephens, Oliver David Jones, Hugo John Miller, III
Life of this patent
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AssigneeLam Research Corporation
InventorsDonald Edgar Stephens, Oliver David Jones, Hugo John Miller, III
Estimating the term…
A method and apparatus for cleaning a wafer oriented vertically is provided. The apparatus includes a first brush and a second brush located horizontally from the first brush. During use, a wafer is orientated vertically between the first and second brushes. The brushes are brought into contact with the wafer and rotated thereby engaging the wafer with rollers. By rotating the rollers, the wafer is also rotated. Liquid is sprayed towards the brushes and wafer. By orienting the wafer vertically, liquid and particulates contained therein readily fall from the wafer due to gravity. This is particularly advantageous when cleaning larger diameter wafers in which particulates must be removed from a larger wafer surface area.
A method of cleaning a substrate comprising:
Dependencies are inferred from the claim text.