Four-mirror extreme ultraviolet (EUV) lithography projection system
AssigneesUltratech Stepper, Inc., The Regents of the University of California
InventorsSimon J Cohen, Hwan J Jeong, David R Shafer
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AssigneesUltratech Stepper, Inc., The Regents of the University of California
InventorsSimon J Cohen, Hwan J Jeong, David R Shafer
Estimating the term…
The invention is directed to a four-mirror catoptric projection system for extreme ultraviolet (EUV) lithography to transfer a pattern from a reflective reticle to a wafer substrate. In order along the light path followed by light from the reticle to the wafer substrate, the system includes a dominantly hyperbolic convex mirror, a dominantly elliptical concave mirror, spherical convex mirror, and spherical concave mirror. The reticle and wafer substrate are positioned along the system's optical axis on opposite sides of the mirrors. The hyperbolic and elliptical mirrors are positioned on the same side of the system's optical axis as the reticle, and are relatively large in diameter as they are positioned on the high magnification side of the system. The hyperbolic and elliptical mirrors are relatively far off the optical axis and hence they have significant aspherical components in their curvatures. The convex spherical mirror is positioned on the optical axis, and has a substantially or perfectly spherical shape. The spherical concave mirror is positioned substantially on the opposite side of the optical axis from the hyperbolic and elliptical mirrors. Because it is positioned off-axis to a degree, the spherical concave mirror has some asphericity to counter aberrations. The spherical concave mirror forms a relatively large, uniform field on the wafer substrate. The mirrors can be tilted or decentered slightly to achieve further increase in the field size.
A system for transferring a pattern on a reticle to a substrate, the reticle illuminated with light, the system comprising:
A system for transferring a pattern on a reticle to a substrate, the system having an optical axis, the system comprising:
A system for transferring a pattern on a reticle to a substrate, the system having an optical axis, the system comprising:
A system for transferring a pattern on a reticle to a substrate, the system having an optical axis, the system comprising:
A system for transferring a pattern on a reticle to a substrate, the system having an optical axis, the system comprising:
A system for projecting patterned light from a reticle to a substrate, the system comprising:
Dependencies are inferred from the claim text.