Method of manufacturing a semiconductor device having a capacitor
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsKiyoshi Mori, Junichi Tsuchimoto
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Abstract
A polysilicon film having a rough surface is formed by a reduced pressure CVD method at a temperature of 575.degree. C. and a deposition pressure of 0.2 Torr. Silicon ions are implanted into the polysilicon film having a rough surface. Thus, the tips of concaves and convexes at the rough surface of the polysilicon film are rounded. Then, this polysilicon film having a rough surface is patterned to form a storage node. A cell plate is formed to cover the storage node with a capacitor insulating layer therebetween. Consequently, a semiconductor device capable of suppressing leak current between capacitor electrodes can be manufactured.
Claims2
A method of manufacturing a semiconductor device having a capacitor formed of a pair of opposite electrode layers with an insulating layer therebetween, comprising the steps of;
- forming a lower electrode layer of said capacitor, which has a surface with concaves and convexes, by polycrystalline silicon;
- rounding tips of said concaves and convexes at the surface of said lower electrode layer by ion implantation of silicon into said lower electrode layer;
- and
- forming an upper electrode layer on the surface of said lower electrode layer with a capacitor insulating layer therebetween.
A method of manufacturing a semiconductor device having a capacitor formed of a pair of opposite electrode layers with an insulating layer therebetween, comprising the steps of:
- forming a lower electrode layer of said capacitor, which has a surface with concaves and convexes, by polycrystalline silicon;
- rounding tips of said concaves and convexes at the surface of said lower electrode layer by implantation of ions other than ions which produce one of a donor and an acceptor when introduced into silicon;
- and
- forming an upper electrode layer on the surface of said lower electrode layer with a capacitor insulating layer therebetween.
Dependencies are inferred from the claim text.