Electron beam profile measurement method and system

A system for measuring electron beam profile in an electronic display device comprising:

• a video pattern generator to drive said electronic display device to cause said electronic display device to display an array of video dots on a display screen thereof, each of said video dots being comprised of a group of phosphor dots illuminated by an electron beam;
• a sensor to take an image of a plurality of groups of illuminated phosphor dots forming video dots within a field of view;
• and
• a processor in communication with said sensor and receiving said image therefrom, said processor processing said image to determine average horizontal and vertical distances of the video dots within said field of view and superimposing each of said groups of illuminated phosphor dots forming the video dots in said field of view that are captured in said image based on the average horizontal and vertical distances of the video dots in said field of view generally to average and to fill in discontinuities between phosphor dots in said groups and thereby generate an overlay image of said electron beam.

A method of measuring electron beam profile in an electronic display device including a display screen and a shadow mask, said method comprising the steps of:

• illuminating video dots on said display screen, said video dots being spatially shifted by a fraction of the pitch of said shadow mask, each of said video dots being comprised of a group of phosphor dots illuminated by an electron beam;
• taking an image of a plurality of groups of illuminated phosphor dots forming an array of video dots within a field of view;
• determining average horizontal and vertical distances of the video dots within said field of view by measuring the distances between the center of masses of the diagonally furthest video dots within said field of view;
• and
• superimposing each of the groups of illuminated phosphor dots forming the video dots in said field of view that are captured in the image based on the average horizontal and vertical distances of the video dots in said field of view generally to average and fill in discontinuities between phosphor dots in the groups and thereby generate an overlay image of said electron beam.