Semiconductor device comprising a plurality of interconnection patterns
AssigneeMitsubushi Denki Kabushiki Kaisha
InventorsShigehiro Kuge, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima
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AssigneeMitsubushi Denki Kabushiki Kaisha
InventorsShigehiro Kuge, Kazutami Arimoto, Masaki Tsukude, Kazuyasu Fujishima
Estimating the term…
On transistors P1, P2, N1 and N2 constituting an NAND gate, interconnection pattern W of metal having high melting point and aluminum interconnection patterns Al1 and Al2 are stacked. A local line LL for connecting transistors P1, P2, N1 and N2 to each other is formed by the interconnection pattern W of metal having high melting point, signal lines SL and SL' for signal input/output between the NAND gate and the outside are formed by aluminum interconnection pattern Al1, and power supply lines VL and VL' for applying power supply potentials Vcc and Vss to the NAND gate are formed by the aluminum interconnection pattern Al2. As compared with the prior art in which the local line LL is formed by the aluminum interconnection pattern Al1, the degree of freedom in layout can be improved and the layout area can be reduced.
A semiconductor integrated circuit formed on a semiconductor substrate, comprising:
A semiconductor integrated circuit formed on a semiconductor substrate, comprising:
Dependencies are inferred from the claim text.