Lithographic proximity correction through subset feature modification
AssigneeMotorola, Inc.
InventorsAlfred John Reich, Hak-Lay Chuang, Michael E. Kling, Paul G. Y. Tsui, Kevin Lucas, James N. Conner
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AssigneeMotorola, Inc.
InventorsAlfred John Reich, Hak-Lay Chuang, Michael E. Kling, Paul G. Y. Tsui, Kevin Lucas, James N. Conner
Estimating the term…
Lithographic Proximity Correction (LPC) shapes are added (503) to a layer of a layout database file (501). Geometric criteria such as feature width are then used to filter the added LPC shapes (502). The LPC shapes are then modified (505) by determining which LPC shapes are within a predetermined distance from a shape in a layer of the second data base (504). The database file, including the modified LPC shapes, is then used to manufacture a set of lithographic masks (506). The lithographic masks are then used to pattern a set of wafers in the manufacture of integrated circuits (507).
A method for modifying a set of lithographic proximity shapes in a design with a plurality of layers and containing the set of lithographic proximity shapes associated with a first set of shapes in the design,
A method for modifying a design including a plurality of layers, the method comprising:
Dependencies are inferred from the claim text.