US 5,949,065 AGranted

Sweep generator circuit for a streak camera

AssigneeFastlite

InventorsDaniel Kaplan, Marcel A. Bouvier

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Abstract

A sweep generator circuit generates a primary pulsed voltage and a secondary voltage which are applied to the deflection plates of a streak camera. A primary pulsed voltage generator includes at least one light operated switch for producing deflection of an electron beam in one direction. A secondary voltage generator means generates the secondary voltage which causes deflection of the electron beam in an opposite direction. Variations in the incident light intensity create substantially identical fluctuations in the deflection of the electron beam produced by the primary pulsed voltage and the secondary voltage. Additionally, any variations with respect to time in the deflection of the electron beam produced by the secondary voltage are small in comparison with variations in the deflection of the electron beam produced by the primary pulsed voltage. The sweep generator circuit has an operating point that is stable with respect to variations in the light intensity.

Claims14

Dependent claims

A sweep generator for a streak camera having first and second deflection plates for deflecting an electron beam resulting from an incident light beam, the sweep generator comprising:

a reference light pulse split from an incident light beam;
primary pulsed voltage generator means, connected to the first and second deflection plates and including at least one switch operated by the reference light pulse, for producing a primary pulsed voltage to deflect the electron beam in one direction;
a secondary voltage generator means connected to the first and second deflection plates, for producing a secondary voltage to deflect the electron beam in a direction opposite to the first direction;
the primary pulsed voltage generator means and the secondary voltage generator means arranged such that fluctuations in the primary pulsed voltage due to fluctuations in the reference light beam are substantially equal to fluctuations in the secondary voltage due to the fluctuations in the reference light beam;
and
variations in deflection of the electron beam with respect to time by the secondary voltage are small in comparison to variations in deflection caused by the primary pulsed voltage.

3 more elements

Dependencies are inferred from the claim text.