Dynamic access memory using silicon-on-insulator
AssigneeSamsung Electronics Co., Ltd.
InventorsKyucharn Park, Yeseung Lee, Cheonsu Ban, Kyungwook Lee
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AssigneeSamsung Electronics Co., Ltd.
InventorsKyucharn Park, Yeseung Lee, Cheonsu Ban, Kyungwook Lee
Estimating the term…
The present invention discloses a method for making a dynamic random access memory by silicon-on-insulator comprising the steps of: dividing a cell area and a peripheral area on a first silicon substrate and recessing just the cell area where a memory device is formed; forming a first insulating layer by isolation of electrical elements in order to divide an active region and a passive region; forming and patterning a first conductive layer through a contact to which the active region and a capacitor are connected on the insulating layer to form a storage node; forming a dielectric layer of the capacitor on the storage node; forming and patterning a polysilicon layer on the dielectric layer to form a storage node; forming a second insulating layer on the plate node and planarizing the insulating layer by thermal treatment; forming a third conductive layer to a predetermined thickness on the planarized insulating layer; polishing and planarizing the third conductive layer by chemical-mechanical polishing technique, using the second insulating layer as an etchstopper and bonding a second silicon substrate on the planarized third conductive layer; planarizing a backside of the first substrate by a chemical-mechanical polishing technique and exposing the active region; and forming a switching element on the forming a bit line.
A semiconductor memory having a memory cell portion and a peripheral portion, comprising:
A semiconductor memory having a memory cell portion and a peripheral portion, comprising:
A semiconductor memory having a memory cell portion and a peripheral portion, comprising:
Dependencies are inferred from the claim text.