Scanning probe microscope

A scanning probe microscope for obtaining optical information relating to a surface of a sample, said scanning probe microscope comprising:

• a cantilever having a probe at a free end thereof;
• a scanner for scanning the probe across the surface of the sample;
• a controller for controlling a distance between a tip of the probe and the surface of the sample;
• a displacement detector for detecting a displacement of the free end of the cantilever;
• an electromagnetic field generator for generating an electromagnetic field between the probe and the sample;
• a light detector for detecting light generated by an effect of the probe on the electromagnetic field;
• an information processor for processing information output by the scanner, the displacement detector and the light detector to thereby form an image related to the surface of sample;
• and
• a display for displaying the processed information,
• wherein the light detector includes an objective placed on an opposite side of the sample with respect to the cantilever, and the objective has an angular aperture exceeding a vertical angle of the probe, said angular aperture being an angle from a focal point of the objective to a diameter of entrance pupil and a maximum angle of a cone of luminous flux entering the objective, with a sine of a half angle thereof corresponding to a numerical aperture of the objective.