Chemical-sensitization positive-working photoresist composition
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsKazufumi Sato, Kazuyuki Nitta, Akiyoshi Yamazaki, Yoshika Sakai, Toshimasa Nakayama
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsKazufumi Sato, Kazuyuki Nitta, Akiyoshi Yamazaki, Yoshika Sakai, Toshimasa Nakayama
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Proposed is a novel chemical sensitization-type positive-working photoresist composition used for the photolithographic patterning works in the manufacture of semiconductor devices exhibiting an excellent halation-preventing effect in the patternwise exposure to light. The composition comprises, in addition to conventional ingredients including an acid-generating agent capable of releasing an acid by the irradiation with actinic rays and a resinous ingredient capable of being imparted with increased solubility in an aqueous alkaline developer solution in the presence of an acid, a unique halation inhibitor which is an esterification product between a specified phenolic compound and a naphthoquinone-1,2-diazide sulfonic acid.
A chemical sensitization-type positive-working photoresist composition which consists essentially of as a uniform blend:
A chemical sensitization-type positive-working photoresist composition which consists essentially of, as a uniform blend:
A chemical sensitization-type positive-working photoresist composition which consists essentially of, as a uniform blend:
A chemical sensitization-type positive-working photoresist composition which consists essentially of, a uniform blend:
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