Lateral diffusion confirming pattern and a method of measuring a lateral diffusion
AssigneeLG Semicon Co., Ltd.
InventorHoon Huh
Life of this patent
Estimating the term…
Abstract
A diffusion confirming pattern for measuring a diffusion distance of an etch-resistant component during a transfer process of a semiconductor device, includes a first photoresist pattern formed on a substrate according to a first mask pattern, and a second photoresist pattern formed on the substrate according to a second mask pattern, wherein the first mask pattern is separated from the second mask pattern by a predetermined interval, the second photoresist pattern is separated from the first photoresist pattern by an interval, and the predetermined interval is compared with the interval between the first and second photoresist patterns to determine the diffusion distance of the etch-resistant component.
Claims12
A diffusion confirming pattern for measuring a diffusion distance of an etch-resistant component during a transfer process of a semiconductor device, said pattern comprising:
- a first photoresist pattern formed on a substrate according to a first mask pattern;
- and
- a second photoresist pattern formed on the substrate according to a second mask pattern, said first mask pattern being separated from said second mask pattern by a predetermined interval, said second photoresist pattern being separated from said first photoresist pattern by an interval, wherein the predetermined interval is compared with the interval between said first and second photoresist patterns to determine the diffusion distance of the etch-resistant component.
A diffusion confirming pattern for measuring a diffusion distance of an etch-resistant component during a transfer process of a semiconductor device, said pattern comprising:
- at least two diffusion confirming unit patterns, each of said unit patterns including a first photoresist pattern formed on a substrate according to one of first mask patterns, and a second photoresist pattern formed on the substrate according to one of second mask patterns, at least one of said second photoresist patterns being separated from corresponding said first photoresist pattern by an interval,
- wherein the first photoresist pattern of one of the diffusion confirming unit patterns is connected to the first photoresist-pattern of another one of the diffusion confirming unit patterns, and
- wherein the interval between said first and second photoresist patterns is compared with one of intervals between the first and second mask patterns to determine a diffusion distance of an etch-resistant component.
Dependencies are inferred from the claim text.