Device for sensing a flat zone of a wafer for use in a wafer probe tester
AssigneeSamsung Electronics Co., Ltd.
InventorSang-bae An
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AssigneeSamsung Electronics Co., Ltd.
InventorSang-bae An
Estimating the term…
A sensing device, for installation in a wafer probe tester for sorting wafers according to the quality thereof, includes a main body for mounting on the wafer probe tester, an upper member and a lower member extending from the main body to define an open area therebetween for insertion of any one of different sized wafers, a plurality of light emitting devices spaced apart at fixed intervals and installed on the upper member, a plurality of light receiving devices spaced apart at respective locations opposed to the light emitting devices across the open area and installed on the lower member, and a control circuit, connected to the light emitting devices and the light receiving devices, for detecting a flat zone of any one of the different sized wafers inserted into the open area. The different sized wafers include 4 inch, 5 inch and 6 inch wafers.
A sensing device for use in discriminating wafers said device comprising:
A sensing device for use in sorting wafers, said device comprising:
Dependencies are inferred from the claim text.