Semiconductor device and method for forming the device using a dual layer, self-aligned silicide to enhance contact performance
AssigneeAdvanced Micro Devices, Inc.
InventorsMark I. Gardner, Fred N. Hause
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AssigneeAdvanced Micro Devices, Inc.
InventorsMark I. Gardner, Fred N. Hause
Estimating the term…
An integrated circuit is formed by a process which can produce highly conductive contact structures. The contact structures result from a dual layer of titanium and cobalt reacted upon silicon-rich source/drain junctions and gate conductor upper surfaces. Reaction on the silicon-rich regions occur concurrent with one another using a self-aligned salicidation process, whereby the titanium layer can consume relatively large amounts of native oxide formed on the silicon-rich regions. In addition to interdiffusion of titanium, cobalt placed upon the titanium enhances the overall conductivity of the contact while providing some barrier properties against undue, additional interdiffusion of titanium and underlying silicon.
A method for forming a silicide, comprising:
A method for forming a silicide, comprising:
A method for forming a silicide, comprising:
Dependencies are inferred from the claim text.