Method of forming a low stress polycide conductors on a semiconductor chip
AssigneeInternational Business Machines Corporation
InventorsAnthony Kendall Stamper, Gary Lionel Langdeau, Richard John Lebel
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AssigneeInternational Business Machines Corporation
InventorsAnthony Kendall Stamper, Gary Lionel Langdeau, Richard John Lebel
Estimating the term…
A method of forming low resistivity conductive lines on a semiconductor substrate is disclosed. In practicing the method a multichamber tool is used to advantage by forming a first doped polysilicon layer on the surface of a substrate, forming a second undoped layer on the doped layer, while maintaining the work piece under a vacuum environment, moving the substrate to a second chamber and thereafter forming a silicide containing layer on the undoped polysilicon layer. Various techniques may be used to deposit either the polysilicon or the silicide layer such as sputtering may also be used. Practice of the method eliminates separation of silicide from polysilicon and increases product yield.
The method of forming a conductive line on the surface of a semiconductor substrate comprising the steps of:
Dependencies are inferred from the claim text.