Semiconductor wafer etching process and semiconductor device
AssigneesNippondenso Co., Ltd., Research Development Corporation of Japan
InventorsKouichi Hoshino, Yoshiki Ueno, Takuya Kouya
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Abstract
A first semiconductor layer and a second semiconductor layer are laminated on a semiconductor wafer in that order. A resist pattern having an opening is formed on the second semiconductor layer. The second semiconductor layer is etched through the opening in the formed resist pattern to expose the first semiconductor layer. A surface oxide film is formed on the exposed surface of the first semiconductor layer and then selectively etched away. Alternatively, the exposed surface of the first semiconductor layer is subjected to a separate oxidization treatment and the resulting surface oxide film is selectively removed in the subsequent etching.
Claims5
A process for etching a semiconductor wafer comprising:
- forming a resist pattern with an opening for recess etching, on the surface of a high electron mobility transistor wafer having an InAlAs buffer layer, InGaAs channel layer, InAlAs spacer layer, InAlAs doped layer, InAlAs gate contact layer and InGaAs cap layer laminated on a semi-insulating InP substrate,
- first etching said InGaAs cap layer up to said InAlAs gate contact layer surface from the opening in the formed resist pattern, and
- selectively etching an InAlAs oxide film formed on said InAlAs gate contact layer surface exposed by the first etching.
A process for etching a semiconductor wafer having a first semiconductor layer and a second semiconductor layer, comprising:
- laminating the first semiconductor layer having a first oxidation surface and the second semiconductor layer having a second oxidation surface on said wafer in that order, wherein the second semiconductor layer is made of a material with a slower etching rate than the first semiconductor layer,
- forming a resist pattern having an opening on said second semiconductor layer,
- first etching the second semiconductor layer through the opening of the resist pattern until the first oxidation surface of the first semiconductor layer is exposed by the etching and the second oxidation surface defines an aperture in the second semiconductor layer,
- forming an oxide film wherein the second oxidation surface and the first oxidation surface exposed in the first etching are oxidized to form an oxide film on surfaces of said first semiconductor layer and said second semiconductor layer, wherein the oxide film formed on said second oxidation surface is thinner than the oxide film formed on said first oxidation surface, and
- selectively etching the oxide film to expose the first semiconductor layer and the second semiconductor layer.
A process for etching a semiconductor wafer comprising:
- laminating a semiconductor layer, a gate contact layer and a cap layer which is made of a material with a slower etching rate than said gate contact layer for a given etching, in that order on a wafer,
- forming a resist pattern with an opening on said cap layer,
- first etching said cap layer through said opening of said resist pattern until said gate contact layer is exposed by the etching,
- oxidizing the surface of said cap layer and said gate contact layer exposed in said first etching step to form an oxide film on the surfaces of said cap layer and said gate contact layer, the oxide film formed on said cap layer being thinner than the oxide film formed on said gate contact layer, and
- second etching said oxide film to expose said cap layer and said gate contact layer,
- wherein during said oxidizing, said oxide film is formed to give a predetermined thickness to said gate contact layer exposed by said second etching step.
A process of etching a semiconductor wafer comprising:
- laminating a semiconductor layer, a gate contact layer and a cap layer which is made of a material with a slower etching rate than said gate contact layer for a given etching, in that order on a wafer,
- forming a resist pattern with an opening on said cap layer,
- first etching said cap layer through said opening of said resist pattern until said gate contact layer is exposed by the etching, and oxide films are formed on surfaces of said cap layer and said gate contact layer after the etching, the oxide film formed on said cap layer being thinner than the oxide film formed on said gate contact layer, and
- second etching said oxide film to expose said cap layer and said gate contact layer.
Dependencies are inferred from the claim text.