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US 5,843,232 AGranted
Measuring deposit thickness in composite materials production
AssigneeGeneral Electric Company
InventorsSudhir Dattatraya Savkar, Robert David Lillquist, Russell Scott Miller
Life of this patent
Estimating the term…
Abstract
This invention relates to novel apparatuses for measuring deposit thickness during composite materials production. More particularly, this invention uses a composite's emission signature or a composite's reflectance signature, to measure deposit thickness.
Claims32
An apparatus for measuring deposit thickness on a workpiece during composite materials production, comprising:
- a spray tank for separating said composite materials production from the surrounding environment;
- a plasma source adjacent said spray tank for generating a plasma plume;
- an infrared imaging means positioned external to said spray tank to view said workpiece during deposition of said powder;
- and
- said infrared imaging means measuring the deposit thickness upon said workpiece by monitoring radiation wavelengths passively emitted by said workpiece and relating any reduction in workpiece intensity due to a reduction in surface emissivity with the deposit thickness on the workpiece using a previously established correlation, as said workpiece smoothes out during deposition.
2 more elements
An apparatus for measuring deposit thickness on a workpiece during composite materials production, comprising:
- a spray tank for separating said composite materials production from a surrounding environment;
- a plasma source adjacent said spray tank for generating a plasma plume;
- a mandrel for holding said workpiece;
- a manipulator rigidly attached to said mandrel for rotating said mandrel within said spray tank such that said workpiece may be completely exposed to said plasma plume;
- an infrared imaging radiometer positioned external to said spray tank to view said workpiece during deposition of said powder;
- and
- said infrared imaging radiometer measuring the deposit thickness upon said workpiece by monitoring the wavelengths which are passively emitted by said workpiece, relating any reduction in the intensity of said workpiece due to a reduction in surface emissivity with the deposit thickness on the workpiece using a previously established correlation, as said workpiece smoothes out during deposition.
4 more elements
An apparatus for measuring deposit thickness on a workpiece during composite materials production, comprising:
- a spray tank for separating said composite materials production from the surrounding environment;
- a plasma source adjacent said spray tank for generating a plasma plume;
- a camera means positioned external to said spray tank for viewing the workpiece surface;
- and
- said camera means measuring the deposit thickness upon said workpiece by monitoring the radiation wavelengths which are reflected by said workpiece and relating any increase in workpiece intensity due to an increase in workpiece surface reflectance with the deposit thickness on the workpiece using a previously established correlation, as said workpiece smoothes out during deposition;
- wherein said camera means uses the reflected background radiation provided by the plasma to measure the deposit thickness.
3 more elements
An apparatus for measuring deposit thickness on a workpiece during composite materials production, comprising:
- a spray tank for separating the composite materials production from the surrounding environment;
- a plasma source adjacent said spray tank for generating a plasma plume;
- a mandrel for maneuvering said workpiece within said plasma plume;
- a manipulator rigidly attached to said mandrel for rotating said mandrel within the spray tank such that said workpiece may be completely exposed to said plasma plume;
- a video camera positioned external to said workpiece for viewing the workpiece surface;
- and
- said video camera measuring the deposit thickness upon said workpiece by monitoring the radiation wavelengths which are emitted by said plasma plume and reflected by said workpiece and relating any increase in workpiece intensity due to an increase in workpiece surface reflectance with the deposit thickness on the workpiece using a previously established correlation, as said workpiece smoothes out during deposition.
4 more elements
An apparatus for measuring deposit thickness on a workpiece during composite materials production, comprising:
- a spray tank for separating the deposition process from the surrounding environment;
- a plasma source adjacent said spray tank for generating a plasma plume;
- a mandrel for maneuvering said workpiece within said plasma plume;
- a manipulator rigidly attached to said mandrel for rotating said mandrel within the spray tank such that said workpiece may be completely exposed to said plasma plume;
- a video camera positioned external to said workpiece for viewing the workpiece surface;
- and
- said video camera measuring the deposit thickness upon said workpiece by monitoring the radiation wavelengths which are emitted by an external light source and reflected by said workpiece and relating any increase in workpiece intensity due to an increase in workpiece surface reflectance with the deposit thickness on the workpiece using a previously established correlation, as said workpiece smoothes out during deposition.
4 more elements
Dependencies are inferred from the claim text.